You signed in with another tab or window. Reload to refresh your session.You signed out in another tab or window. Reload to refresh your session.You switched accounts on another tab or window. Reload to refresh your session.Dismiss alert
I am using the ESP32s3 touch peripheral to **read Four different touch pins **. in the TRM it is mentioned that "scan mode can be enabled by specifying the bit map of enabled touch pins in RTC_CNTL_TOUCH_SCAN_PAD_MAP in RTC_CNTL_TOUCH_SCAN_CTRL_REG" but I couldn't find a way to disable it, as setting the bits in the bit map to 0 will prevent all touch pins from starting .
Is it possible to get multiple touch pins to sample simultaneously instead of sampling in scan mode (shown in the figure ). The reason I want to do that is to reduce the overall delay.
reacted with thumbs up emoji reacted with thumbs down emoji reacted with laugh emoji reacted with hooray emoji reacted with confused emoji reacted with heart emoji reacted with rocket emoji reacted with eyes emoji
-
Hi Everyone !
I am using the ESP32s3 touch peripheral to **read Four different touch pins **. in the TRM it is mentioned that "scan mode can be enabled by specifying the bit map of enabled touch pins in RTC_CNTL_TOUCH_SCAN_PAD_MAP in RTC_CNTL_TOUCH_SCAN_CTRL_REG" but I couldn't find a way to disable it, as setting the bits in the bit map to 0 will prevent all touch pins from starting .
Is it possible to get multiple touch pins to sample simultaneously instead of sampling in scan mode (shown in the figure ). The reason I want to do that is to reduce the overall delay.
Beta Was this translation helpful? Give feedback.
All reactions