[test-e2e] Disable broken test (intel#13091)

Post-commit testing has been failing for multiple weeks. The root cause
of this is sycl/test-e2e/Plugin/interop-level-zero-image.cpp which has
been failing on the ARC GPUs consistently. This has clouded other test
failures - why should anyone care about post-commit testing if it's
already red.

We should disable this test to lower the noise level; it's too late to
revert the patch that introduced it.

See intel#13090

Author: ldrumm

sycl/test-e2e/Plugin/interop-level-zero-image.cpp

@@ -3,7 +3,8 @@
 // RUN: %{run} %t.out
 
 // spir-v gen for legacy images at O0 not working
-// UNSUPPORTED: O0
+// UNSUPPORTED: gpu-intel-dg2
+// This test is currently broken see https://github.com/intel/llvm/issues/13090
 
 // This test verifies that make_image is working for 1D, 2D and 3D images.
 // We instantiate an image with L0, set its body, then use a host accessor to