tests: drivers: adc_dma: fix sampling interval failing NXP tests

In 6e21ebf the sampling interval was changed, which caused the
issue #56070. This is fixed by allowing different boards to
specify a sampling period.

Also changed the test_task_with_interval to verify that
the supplied interval was used.

Signed-off-by: Hein Wessels <[email protected]>

Author: heinwessels

tests/drivers/adc/adc_dma/src/test_adc.c

@@ -2,6 +2,7 @@
  * Copyright (c) 2018 Nordic Semiconductor ASA
  * Copyright (c) 2016 Intel Corporation
  * Copyright (c) 2020, NXP
+ * Copyright (c) 2023, Nobleo Technology
  *
  * SPDX-License-Identifier: Apache-2.0
  */
@@ -23,6 +24,7 @@
 #define ADC_1ST_CHANNEL_ID 26
 #define COUNTER_NODE_NAME pit0
 #define HW_TRIGGER_INTERVAL (2U)
+#define SAMPLE_INTERVAL_US HW_TRIGGER_INTERVAL
 
 #elif defined(CONFIG_BOARD_FRDM_K82F)
 
@@ -34,6 +36,7 @@
 #define ADC_1ST_CHANNEL_ID 26
 #define COUNTER_NODE_NAME pit0
 #define HW_TRIGGER_INTERVAL (2U)
+#define SAMPLE_INTERVAL_US HW_TRIGGER_INTERVAL
 
 #elif defined(CONFIG_BOARD_NUCLEO_H743ZI)
 
@@ -64,8 +67,12 @@
 #define BUFFER_MEM_REGION EMPTY
 #endif
 
-/* for DMA HW trigger interval need large than HW trigger interval*/
-#define SAMPLE_INTERVAL_US (10000U)
+/* The sample interval between consecutive samplings. Some drivers require
+ * specific values to function.
+ */
+#if !defined(SAMPLE_INTERVAL_US)
+#define SAMPLE_INTERVAL_US 0
+#endif
 
 #define BUFFER_SIZE 24
 #ifndef ALIGNMENT
@@ -284,7 +291,7 @@ static int test_task_asynchronous_call(void)
 	const struct adc_sequence_options options = {
 		.extra_samplings = 4,
 		/* Start consecutive samplings as fast as possible. */
-		.interval_us = 0,
+		.interval_us = SAMPLE_INTERVAL_US,
 	};
 	const struct adc_sequence sequence = {
 		.options = &options,
@@ -348,7 +355,7 @@ static int test_task_with_interval(void)
 	int64_t milliseconds_spent;
 
 	const struct adc_sequence_options options = {
-		.interval_us = 500UL, /*make this double to sample time*/
+		.interval_us = 100 * 1000, /* 10 ms - much larger than expected sampling time */
 		.callback = sample_with_interval_callback,
 		.extra_samplings = 1,
 	};
@@ -372,7 +379,7 @@ static int test_task_with_interval(void)
 		time_stamp = k_uptime_get();
 		ret = adc_read(adc_dev, &sequence);
 		milliseconds_spent = k_uptime_delta(&time_stamp);
-		printk("now spend = %lldms\n", milliseconds_spent);
+		zassert_true(milliseconds_spent >= (options.interval_us / 1000UL));
 		zassert_equal(ret, 0, "adc_read() failed with code %d", ret);
 	}
 	check_samples2(1 + options.extra_samplings);
@@ -438,7 +445,6 @@ static int test_task_repeated_samplings(void)
 		 */
 		.extra_samplings = 2,
 		/* Start consecutive samplings as fast as possible. */
-		/* but the interval shall be larger than the HW trigger*/
 		.interval_us = SAMPLE_INTERVAL_US,
 	};
 	const struct adc_sequence sequence = {