[SYCL][E2E] Reenable in_order_profiling_queue for L0 #14328
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Due to some confusion about the output from the in_order_profiling_queue test on L0, the test was disabled. However, the test can be safely reenabled for that target, while keeping it disabled for FPGA. Additionally, the failure in profiling_queue is believed to be due to the same issue, so the JIRA has been added to it and the note in in_order_profiling_queue has been updated to reflect the known information about the failure. Signed-off-by: Larsen, Steffen <[email protected]>
sarnex
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steffenlarsen
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cperkinsintel
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Due to some confusion about the output from the in_order_profiling_queue test on L0, the test was disabled. However, the test can be safely reenabled for that target, while keeping it disabled for FPGA.
Additionally, the failure in profiling_queue is believed to be due to the same issue, so the JIRA has been added to it and the note in in_order_profiling_queue has been updated to reflect the known information about the failure.