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tests: drivers: adc_dma: fix sampling interval failing NXP tests #56104
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tests: drivers: adc_dma: fix sampling interval failing NXP tests #56104
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@hakehuang would you mind testing this code? |
@teburd this code will fix half the issue you observed. It should finish the first two tests, and the crash on the third. The other half is caused by a few limitations in the NXP ADC driver, which @hakehuang is fixing, and will likely have a PR ready for soon. |
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Ah, that looks correct. The crash and failing tests will be fixed by hakehuang. |
In 6e21ebf the sampling interval was changed, which caused the issue zephyrproject-rtos#56070. This is fixed by allowing different boards to specify a sampling period. Also changed the test_task_with_interval to verify that the supplied interval was used. Signed-off-by: Hein Wessels <[email protected]>
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@heinwessels , one qeustion, how can I create a PR base on your PR? |
Can we merge this PR as is? @anangl @teburd It doesn't block CI, as it's not run. Maybe @hakehuang can show that all tests pass if he applies his changes on top of mine. Other option is that you |
with your fix and my PR #56120 test log is patch there |
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need work with
#56120
@anangl sorry did not realize that the test was not NXP specific and merged without waiting for your approval, lmk if this was not ok and should be reworked. |
add support for async call and repeat sample test 1. change the DMA req to 2 byte each 2. increase the buffer pre-dma 3. add protection on invalid buffer depends on: PR #56104 fixing: issue #56070 Signed-off-by: Hake Huang <[email protected]>
In 6e21ebf the sampling interval was changed, which caused the issue #56070. This is fixed by allowing different boards to specify a sampling period.
Also changed the test_task_with_interval to verify that the supplied interval was used.